當前位置：無錫奧本精密工業(yè)有限公司>>長度類精密計量儀器>>干涉儀>>MicroXAM白光干涉輪廓儀干涉儀

MicroXAM白光干涉輪廓儀干涉儀

返回列表頁

參考價

面議

具體成交價以合同協(xié)議為準

產(chǎn)品型號

品牌

廠商性質(zhì)其他

所在地無錫市

在線詢價收藏產(chǎn)品查看聯(lián)系電話

包裝印刷網(wǎng)采購部電話：0571-88918531QQ:2568841715

聯(lián)系方式：查看聯(lián)系方式

更新時間：2025-03-19 12:11:29瀏覽次數(shù)：21次

聯(lián)系我時，請告知來自包裝印刷網(wǎng)

產(chǎn)品分類 品牌分類

  長度類精密計量儀器

位移傳感器

測長儀

測距儀

干涉儀

粗糙度輪廓儀

水平儀

千分尺

GPS測量儀

全站儀

經(jīng)緯儀

環(huán)規(guī)

齒輪儀

刀具預(yù)調(diào)儀

氣動量儀

測微儀

跳動儀

量塊

粗糙度儀

圓柱度儀

凸輪儀

測高儀

齒輪測量中心

真圓度儀

三坐標測量儀

工具顯微鏡

卡尺

全部產(chǎn)品列表

暫無信息

無錫奧本精密工業(yè)有限公司

經(jīng)營模式：其他

商鋪產(chǎn)品：151條

所在地區(qū)：江蘇無錫市

詢價 給他留言

產(chǎn)品簡介

白光干涉輪廓儀干涉儀產(chǎn)品主要特點:MicroXAM白光干涉輪廓儀干涉儀納米輪廓儀

詳細介紹

白光干涉輪廓儀干涉儀產(chǎn)品主要特點:

MicroXAM白光干涉輪廓儀干涉儀納米輪廓儀，微納米加工測量，蘋果（apple)輪廓儀

OVERVIEW

The MicroXAM-100 complements our surface profiling portfolio with a research grade, non-contact optical profiler. The MicroXAM-100 is a full-featured white light and

phase-shifting interferometer that brings a powerful set of features and capabilities to the general research community. The system provides precise high-resolution, non-contact 3D profiles on both smooth and rough surfaces. The intuitive user interface allows for a fast learning curve ensuring quick and productive use of the tool in any environment.

The MicroXAM-100 can measure fields of view from 100 X 100 microns to

1.0mm x 1.0mm (dependent on the objective lens used). The MicroXAM-100 optical interferometer quickly and accurately measures the 3D topography of surfaces at the nanometer level with a z-scan range of 250 microns (or up to 10 mm with Z-stitching). Multiple images can be stitched together to produce extended fields of view.

PSI (phase) and VSI mode (vertical) with patented noise suppression technology
100 µm closed loop piezo stage and 10mm z-stage for VSI scanning mode
Sample stages up to 8" (200mm) with full stage travel
X-Y stage options supporting manual, motorized, and programmable 4, 6, and 8" (100, 150, and 200mm)
Sequence, Stitching, Thick film thickness, dissimilar materials, and masking measurement modules.

The MicroXAM-1200 3D non-contact profilometer is a surface characterization solution for a wide range of applications and industries - from R&D departments, universities, and commercial labs to production monitoring and process control in IC manufacturing and data storage. The non-contact profilometer uses white light interferometry to generate high-resolution 3D images that provide the industry’s highest vertical resolution with excellent repeatability and precision, and superior reliability measurements. This surface analysis solution delivers automated data collection, automated analysis and reporting, with 2D or 3D advanced analysis suite to address a variety of application and reporting needs.

PSI (phase) and VSI mode (vertical) with patented noise suppression technology
100 µm closed loop piezo stage and 10mm z-stage for VSI scanning mode
Sample stages up to 8" (200mm) with full stage travel
X-Y stage options supporting manual, motorized, and programmable 4, 6, and 8" (100, 150, and 200mm)
Sequence, Stitching, Thick film thickness, dissimilar materials, and masking measurement modules.

MicroXAM白光干涉輪廓儀干涉儀

The precision engineered hardware along with powerful yet simple to use MapVUE^® AE analysis software package offers the user a number of parameter calculations, filtering options, imaging analysis and automated report generation to meet the most stringent R&D and production environment needs. MapVUE AE’s user interface offers simple recipe development, automated sequencing, and with a range of analysis tools. The flexibility of the instrument is further demonstrated with its mix of objectives and sample stages available to meet the need of each application with customization.

APPLICATIONS

Medical Devices

MicroXAM白光干涉輪廓儀干涉儀

Surface texture, defect inspection, wear volume measurement and film thickness measurement of medical implants such as heart-valves, artificial joints, dental implants and stents.

Precision Machining

Wear on cylindrical surface, grain structure analysis, surface roughness characterization and form measurement

Data Storage

LED

Sapphire substrate roughness, waviness and edge roll-off; patterned sapphire bump height and width; defect characterization, and step height for photo resist and metallization

Semiconductors and Electronics

Wafer inspection including height of through silicon via and bond pads, height of deposition and etch steps film thickness, critical dimension measurement

Optics

Surface pattern and feature dimensions of holographic elements, micro-lens arrays, gem surface facet surface analysis and critical dimensioning, fiber optics connector end-face, etch performance and mask quality.

MEMS

MicroXAM白光干涉輪廓儀干涉儀

Shape, surface detail and defect features of MEMS sensors, actuators, deformable optics and pumps. Non contact process allows in situ measurement of activated structures.

MicroXAM白光干涉輪廓儀干涉儀